To optimize the process of calculating the reliability of bullet-borne solid-state memory and facilitate the design of predicting the overall system failure and reliability in the initial stage of research and development, a research method of fault tree analysis and the reliability of bullet-loaded solid-state memory based on a Bayesian network is proposed. In this method the fault tree model is transformed into a Bayesian network model according to the mapping rules, the bucket elimination method is introduced to factorize the joint probability chain, and the failure probability of each node combined with the bidirectional inference algorithm of the Bayesian network is calculated. The calculation results show that the method can quickly and efficiently identify the weak links of the system, predict the failure probability and the importance of the components, propose a redundancy design, improve the system reliability, and provide a reference for the development of bullet-borne solid-state memory in the future.
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