[Author(id=1197663002499007287, tenantId=1045748351789510663, journalId=null, articleId=1160175344851542128, orderNo=null, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=null, email=null, emailSecond=null, emailThird=null, correspondingAuthor=null, authorType=null, ext={CN=AuthorExt(id=null, tenantId=null, journalId=1155139928303341790, articleId=1160175344851542128, authorId=1197663002499007287, language=CN, stringName=刘志高, 侯斌, 刘天寒, 秦红波, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=null, address=null, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null)}, companyList=null)]
刘志高, 侯斌, 刘天寒, 秦红波.
基于纳米压痕法的富Sn相应力-应变关系的研究[J].
桂林电子科技大学学报, 2022, 42(02): 161-165 DOI:10.16725/j.cnki.cn45-1351/tn.2022.02.001