基于 LSTM-贝叶斯融合模型的器件退化识别与寿命预测

赵耀斌 ,  张帆 ,  王丽垚 ,  王鹏 ,  袁进一

中国民航大学学报 ›› 2026, Vol. 44 ›› Issue (5) : 43 -51.

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中国民航大学学报 ›› 2026, Vol. 44 ›› Issue (5) : 43 -51. DOI: 10.27055/j.1674-5590.2026.05.005

基于 LSTM-贝叶斯融合模型的器件退化识别与寿命预测

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Device degradation identification and lifetime prediction based on an LSTM-Bayesian fusion model

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摘要

面对高可靠性器件退化数据及失效样本稀缺、寿命预测不确定性难以量化的问题,本文提出一种融合长短期记忆(LSTM,long short-term memory)网络、Bootstrap集合学习与蒙特卡洛dropout(MCD,Monte-Carlo dropout)的小样本退化寿命预测方法首先,将退化序列转化为滑动窗口样本,并采用Bootstrap训练模型集合其次,在预测阶段,结合MCD采样,综合表征数据与模型的不确定性,获得点预测以及85%、90%和95%预测区间,利用早期观测信息进行退化分型并分别训练子模型,以提高长期外推的稳定性并减小预测区间宽度最后,采用80 ℃条件下20只钨丝灯泡的加速退化试验(ADT,accelerated degradation test)照度序列对本文所提方法进行验证结果表明,该方法能够稳定识别退化类型,准确预测退化趋势,并给出可靠的剩余寿命区间,可为高可靠性器件的可靠性评估与寿命论证提供量化依据。

Abstract

To address the scarcity of degradation data and failure samples and the difficulty in quantifying lifetime-prediction uncertainty for high-reliability devices, this paper proposes a small-sample degradation lifetime prediction method. The method integrates a long short-term memory (LSTM) network, Bootstrap ensemble learning and Monte Carlo dropout (MCD). Firstly, the degradation sequences are transformed into sliding-window samples, and Bootstrap is used to train a model ensemble. Secondly, in the prediction stage, by incorporating MCD sampling, the data uncertainty and model uncertainty are jointly characterized, and point predictions as well as the 85%, 90%, and 95% prediction intervals are obtained. Early observations are then used for degradation typing, and sub-models are trained separately to improve the stability of long-term extrapolation and to reduce prediction interval width. Finally, the proposed method is validated using the illuminance sequences of 20 tungsten filament bulbs obtained from an accelerated degradation test (ADT) at 80 ℃. The results show that the proposed method can stably identify degradation types, accurately predict degradation trends and provide reliable remaining useful life intervals. It thus offers a quantitative basis for the reliability assessment and life substantiation of highly reliable devices.

关键词

加速退化试验(ADT) / 长短期记忆(LSTM)网络 / 小样本退化数据 / 置信区间 / 早期分型

Key words

accelerated degradation test (ADT) / long short-term memory (LSTM) network / small-sample degradation data / confidence interval / early typing

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赵耀斌,张帆,王丽垚,王鹏,袁进一. 基于 LSTM-贝叶斯融合模型的器件退化识别与寿命预测[J]. 中国民航大学学报, 2026, 44(5): 43-51 DOI:10.27055/j.1674-5590.2026.05.005

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基金资助

中央高校基本科研业务费项目(3122026018)

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